Nightingale EOS

Welcome to Nightingale-EOS

March 14th
Nightingale-EOS will be demonstrating the
n-Gauge™ coating metrology tool in Minneapolis.
more info...

March 3rd
Nightingale-EOS Limited
appoints Executive Chairman.
more info...

November 30th
Nightingale-EOS exhibited the
n-Gauge™ at the Institute of Physics, London
more info...

November 9th
Article by Stephen Morris describing the n-Gauge featured in November edition of EMDT.
more info...

Nightingale-EOS Limited is an innovative optical company that is bringing to market a unique laser-based technology for characterising thin coatings on a range of devices, with a particular emphasis on medical implants. Our n-Gauge™ metrology product is a major step forward for in-line metrology of thin-film coatings on small engineered parts such as cardiac stents, orthopaedic prosthetics and MEMS devices, as well as offering a cost-effective metrology solution for established applications such as silicon wafers, solar cells and flat-panel displays.

Capabilities

• Accurate, simultaneous measurement of thickness and
• material properties.
• No prior information required about film optical
• properties (e.g. n & k variation with wavelength).
• Entirely non-destructive.
• Valid for multiple layers.
• Thickness range <100nm to >10μm.

Advantages

• Submicron measurement spot size.
• Fast turnaround time.
• Multiple measurements can be made on a
• single sample, assessing coating uniformity.
• Helps device manufacturers to comply with
• the FDA’s initiative for adopting Process
• Analytical Technology (PAT) methodologies.