March 14th
Nightingale-EOS will be demonstrating the
n-Gauge™ coating metrology tool in Minneapolis. more info...
March 3rd
Nightingale-EOS Limited
appoints Executive Chairman. more info...
November 30th
Nightingale-EOS exhibited the n-Gauge™ at the Institute of Physics, London more info...
November 9th
Article by Stephen Morris describing the n-Gauge featured in November edition of EMDT. more info...
The company’s first product is the n-Gauge™, a cost-effective coating thickness metrology
tool with wide applications for:
• medical devices • microengineered parts • silicon wafers
• solar cells • displays • optical coatings
…and many others – wherever in fact a thin transparent film is deposited upon a substrate.
Details
The product takes the form of
a module which can be used in
conjunction with a standard optical microscope; initially the Nikon Eclipse LV-100 series is supported with others to be added in due course.
The n-Gauge™ replaces the
microscope’s existing illumination module and eyepiece turret, but includes its own high-quality white light illumination source and colour camera, together with software to capture live video and record images – giving users a high-quality video microscope system as well as an accurate metrology tool.
A single Ethernet cable passes from the n-Gauge™ to an adjacent computer which provides an intuitive Graphical User Interface and sophisticated data processing and storage facilities.
